I work for an IC testing company (Credence Systems) and I know that what
you're saying isn't true. In fact, it's just pure geometry. You don't even
have to understand the physics of it.
Frank Paris
marshalt@spiritone.com
http://albums.photopoint.com/j/AlbumList?u=62684
> It isn't true that because the die is
> larger simply because of process size, that the yield goes
> down...in fact it
> typically goes up.
>